Oxidation Dependence on Defect Density in 3C-SiC Films

Journal of the Electrochemical Society

Volumn 148, Issue 6, 2001, Pages

  Eickhoff, M ^a,c   Vouroutzis, N ^b   Nielsen, A ^a   Krotz G ^a   Stoemenos, J ^b  

^a DAIMLER AG   (Germany)

^b ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

^c WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005758472     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1370972     Document Type: Article

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