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Volumn 1999-W, Issue , 1999, Pages 283-288

Investigation of Micro-scale Materials Behavior with MEMS

Author keywords

[No Author keywords available]

Indexed keywords

HEAT TRANSFER; MEMS;

EID: 0005487091     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/IMECE1999-0281     Document Type: Conference Paper
Times cited : (4)

References (8)
  • 1
    • 0032305443 scopus 로고    scopus 로고
    • Young's Modulus, Yield Strength, and Fracture Strength of Microelements Determined by Tensile Testing
    • Greek, S., and F. Ericson “Young's Modulus, Yield Strength, and Fracture Strength of Microelements Determined by Tensile Testing”, Materials Research Society Symposium Proceedings, Vol. 518, 1998.
    • (1998) Materials Research Society Symposium Proceedings , vol.518
    • Greek, S.1    Ericson, F.2
  • 3
    • 0030378221 scopus 로고    scopus 로고
    • Film Thickness Effect on Tensile Properties and Microstructures of Submicron Aluminum Thins Films on Polyimide
    • Kang, Y.S., P. S. Ho, R. Knipe, and J. Tregilgas, “Film Thickness Effect on Tensile Properties and Microstructures of Submicron Aluminum Thins Films on Polyimide”, Materials Research Society Symposium Proceedings, Vol. 436, 1996.
    • (1996) Materials Research Society Symposium Proceedings , vol.436
    • Kang, Y.S.1    Ho, P. S.2    Knipe, R.3    Tregilgas, J.4
  • 4
    • 0032670867 scopus 로고    scopus 로고
    • Accurate Determination of the Mechanical Properties of Thin Aluminum Films Deposited on Sapphire Flats Using Nanoindentations
    • Lim, Y. Y., M. M. Chaudhri, and Y. Enomoto “Accurate Determination of the Mechanical Properties of Thin Aluminum Films Deposited on Sapphire Flats Using Nanoindentations”, Journal of Materials Research, Vol. 14 No. 6, 1999.
    • (1999) Journal of Materials Research , vol.14 , Issue.6
    • Lim, Y. Y.1    Chaudhri, M. M.2    Enomoto, Y.3
  • 5
    • 0000160233 scopus 로고    scopus 로고
    • Measurement of Forces and Spring Constants of Microinstruments
    • Saif, M.T.A. and N.C. MacDonald, “Measurement of Forces and Spring Constants of Microinstruments”, Review of Scientific Instruments, Vol. 69 No. 3, 1998.
    • (1998) Review of Scientific Instruments , vol.69 , Issue.3
    • Saif, M.T.A.1    MacDonald, N.C.2
  • 6
    • 0028333279 scopus 로고
    • SCREAM I: A Single Mask Single-Crystal Silicon, Reactive Ion Etching Process for Micro-electro-mechanical Structures
    • Shaw, K. A., Z. L. Zhang, and N. C. MacDonald, “SCREAM I: A Single Mask Single-Crystal Silicon, Reactive Ion Etching Process for Micro-electro-mechanical Structures”, Sensors and Actuators, A, Vol. 40, 1994.
    • (1994) Sensors and Actuators, A , vol.40
    • Shaw, K. A.1    Zhang, Z. L.2    MacDonald, N. C.3
  • 8
    • 0024069463 scopus 로고
    • Mechanical Deflection of Cantilever Microbeams: A New Technique for Testing the Mechanical Properties of Thin Films
    • Weihs, T. P., S. Hong, J. C. Bravman and W. D. Nix, 'Mechanical Deflection of Cantilever Microbeams: A New Technique for Testing the Mechanical Properties of Thin Films", Journal of Materials Research, Vol. 3 No. 5, 1988.
    • (1988) Journal of Materials Research , vol.3 , Issue.5
    • Weihs, T. P.1    Hong, S.2    Bravman, J. C.3    Nix, W. D.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.