Microstructure characterization of amorphous thin solid films in a fringe-free environment

Journal of Applied Physics

Volumn 85, Issue 1, 1999, Pages 388-396

  Li, Tong ^a   Kanicki, Jerzy ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005186648     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369460     Document Type: Article

References (22)

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