Spectroscopic light scattering for real-time measurements of thin film and surface evolution

Applied Physics Letters

Volumn 72, Issue 25, 1998, Pages 3276-3278

  Chason, Eric ^a   Sinclair, Michael B ^a   Floro, Jerry A ^a   Hunter, John A ^a   Hwang, Robert Q ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005094793     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121622     Document Type: Article

References (12)

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