A new data processing method to determine accurate density and size distribution of defects by bright field infrared laser interferometer (optical precipitate profiler)

Review of Scientific Instruments

Volumn 69, Issue 9, 1998, Pages 3283-3289

  Nakai, Katsuhiko ^a   Matsumura, Atsuki ^a   Harada, Hirofumi ^b  

^a NIPPON STEEL CORPORATION   (Japan)

^b NSC Electron Corporation   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005064928     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149093     Document Type: Article

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