High-resolution scanning optical microscopy of ferroelectric thin films

Ferroelectrics

Volumn 222, Issue 1-4, 1999, Pages 181-188

  Levy, Jeremy ^a   Hubert, Charles ^a   Carter, Adrian C ^b   Chang, Wontae ^b   Kirchoefer, Steven W ^b   Horwitz, James S ^b   Chrisey, Douglas B ^b  

^a UNIVERSITY OF PITTSBURGH   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

Apertureless near field scanning optical microscopy; Confocal scanning optical microscopy; Ferroelectric thin films

Indexed keywords

EID: 0004902142     PISSN: 00150193     EISSN: None     Source Type: Journal    
DOI: 10.1080/00150199908014814     Document Type: Article

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