Synchrotron-radiation stimulated desorption of SiO2 thin films on Si(111) surfaces observed by scanning tunneling microscopy

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 17, Issue 4, 1999, Pages 1733-1736

  Miyamae, T ^a   Uchida, H ^b   Munro, I H ^c   Urisu, T ^a  

^a INSTITUTE FOR MOLECULAR SCIENCE   (Japan)

^b TOYOHASHI UNIVERSITY OF TECHNOLOGY   (Japan)

^c UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004562547     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581882     Document Type: Article

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