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Volumn 17, Issue 4, 1998, Pages 372-374
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Comments on "a small-signal MOSFET model for radio frequency 1C applications"
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Author keywords
Gate noise; Gate resistance; Lumped element model; Mosfet rf modeling; Small signal model
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Indexed keywords
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EID: 0002284969
PISSN: 02780070
EISSN: None
Source Type: Journal
DOI: 10.1109/43.703827 Document Type: Article |
Times cited : (24)
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References (4)
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