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Volumn 17, Issue 4, 1998, Pages 372-374

Comments on "a small-signal MOSFET model for radio frequency 1C applications"

Author keywords

Gate noise; Gate resistance; Lumped element model; Mosfet rf modeling; Small signal model

Indexed keywords


EID: 0002284969     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.703827     Document Type: Article
Times cited : (24)

References (4)
  • 1
    • 0028547702 scopus 로고    scopus 로고
    • "Impact of distributed gate resistance on the performance of MOS devices,"
    • vol. 41, pp. 750-754, Nov. 1994.
    • B. Razavi, R. H. Yan, and K. F. Lee, "Impact of distributed gate resistance on the performance of MOS devices," IEEE Trans. Circuits Syst. I, vol. 41, pp. 750-754, Nov. 1994.
    • IEEE Trans. Circuits Syst. I
    • Razavi, B.1    Yan, R.H.2    Lee, K.F.3
  • 2
    • 0029244247 scopus 로고    scopus 로고
    • "Design of high-speed, low power frequency dividers and phase-locked loops in deep submicron CMOS,"
    • vol. 30, pp. 101-109, Feb. 1995.
    • B. Razavi, K. F. Lee, and R. H. Yan, "Design of high-speed, low power frequency dividers and phase-locked loops in deep submicron CMOS," IEEE]. Solid-State Circuits, vol. 30, pp. 101-109, Feb. 1995.
    • IEEE. Solid-State Circuits
    • Razavi, B.1    Lee, K.F.2    Yan, R.H.3
  • 3
    • 0031147079 scopus 로고    scopus 로고
    • "A 1.5 V, 1.5 GHz CMOS low noise amplifier,"
    • vol. 32, pp. 745-759, May 1997.
    • D. K. Shaeffer and T. H. Lee, "A 1.5 V, 1.5 GHz CMOS low noise amplifier," IEEEJ. Solid-State Circuits, vol. 32, pp. 745-759, May 1997.
    • IEEEJ. Solid-State Circuits
    • Shaeffer, D.K.1    Lee, T.H.2
  • 4
    • 33747491124 scopus 로고    scopus 로고
    • MOSIS Parametric Test Results, http://www.mosis.org/vendors.html.
    • MOSIS Parametric Test Results, http://www.mosis.org/vendors.html.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.