Characterization of a charge–coupled–device detector in the 1100–0.14–nm (1–eV to 9–keV) spectral region

Applied Optics

Volumn 38, Issue 1, 1999, Pages 29-36

  Poletto, Luca ^a   Boscolo, Alessio ^a   Tondello, Giuseppe ^a  

^a UNIVERSITY OF PADOVA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002187592     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.000029     Document Type: Article

References (12)

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