The Investigation into Charge Degradation of MIS Structures under Strong Electric Field by a Method of Controlled Current Load

Russian Microelectronics

Volumn 29, Issue 2, 2000, Pages 97-103

  Andreev, V V ^a,b   Baryshev, V G ^a,b   Bondarenko, G G ^a,b   Stolyarov, A A ^a,b   Shakhnov, V A ^a,b  

^a BAUMAN MOSCOW STATE TECHNICAL UNIVERSITY   (Russian Federation)

^b NATIONAL RESEARCH UNIVERSITY HIGHER SCHOOL OF ECONOMICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002171815     PISSN: 10637397     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02773241     Document Type: Article

References (20)

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