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Volumn 9, Issue 1, 1996, Pages 57-58
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1,3,5-Tris[4-(rerf-butoxycarbonylmethoxy)-phenyl]benzene as a novel electron-beam positive resist for nanometer lithography
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001957559
PISSN: 09149244
EISSN: None
Source Type: Journal
DOI: 10.2494/photopolymer.9.57 Document Type: Article |
Times cited : (29)
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References (3)
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