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Volumn 9, Issue 1, 1996, Pages 57-58

1,3,5-Tris[4-(rerf-butoxycarbonylmethoxy)-phenyl]benzene as a novel electron-beam positive resist for nanometer lithography

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[No Author keywords available]

Indexed keywords


EID: 0001957559     PISSN: 09149244     EISSN: None     Source Type: Journal    
DOI: 10.2494/photopolymer.9.57     Document Type: Article
Times cited : (29)

References (3)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.