Integrating testability into microsystems

Microsystem Technologies

Volumn 3, Issue 2, 1997, Pages 72-79

  Olbrich, T ^a   Richardson, A ^b   Vermeiren, W ^c   Straube, B ^c  

^a AMS AG   (Austria)

^b LANCASTER UNIVERSITY   (United Kingdom)

^c FRAUNHOFER INSTITUTE FOR INTEGRATED CIRCUITS IIS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001937938     PISSN: 09467076     EISSN: None     Source Type: Journal    
DOI: 10.1007/s005420050059     Document Type: Article

References (30)

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