Design-for-test strategies for analogue and mixed-signal integrated circuits

Midwest Symposium on Circuits and Systems

Volumn 2, Issue , 1995, Pages 1139-1144

  Richardson, Andrew ^a   Olbrich, Thomas ^a   Liberali, Valentino ^a   Maloberti, Franco ^a  

^a LANCASTER UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; CONTROLLABILITY; DIGITAL CIRCUITS; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; LINEAR INTEGRATED CIRCUITS; OBSERVABILITY; PERFORMANCE; SPECIFICATIONS;

DESIGN FOR TEST; FUNCTIONAL AND SPECIFICATION TEST; MIXED SIGNAL INTEGRATED CIRCUITS;

INTEGRATED CIRCUITS;

EID: 0029453471     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (25)