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Volumn 24, Issue 13, 1999, Pages 866-868

Polarized light-scattering measurements of dielectric spheres upon a silicon surface

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001695443     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.24.000866     Document Type: Article
Times cited : (31)

References (14)
  • 5
    • 84975633498 scopus 로고    scopus 로고
    • G. Videen, J. Opt. Soc. Am. A 8, 483 (1991); 9, 844 (1992).
    • J. Opt. Soc. Am. A , vol.9 , pp. 844
  • 9
    • 84975659916 scopus 로고
    • we do not include their shadow factor
    • K. B. Nahm and W. L. Wolfe, Appl. Opt. 26, 2995 (1987); we do not include their shadow factor.
    • (1987) Appl. Opt. , vol.26 , pp. 2995
    • Nahm, K.B.1    Wolfe, W.L.2
  • 14
    • 84894004866 scopus 로고    scopus 로고
    • Measurement of 100 nm NIST SRM 1963 by differential mobility analysis
    • to be published
    • G. W. Mulholland, N. P. Bryner, and C. Croarkin, "Measurement of 100 nm NIST SRM 1963 by differential mobility analysis," J. Aerosol Sci. Technol. (to be published).
    • J. Aerosol Sci. Technol.
    • Mulholland, G.W.1    Bryner, N.P.2    Croarkin, C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.