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Volumn 55, Issue C, 1997, Pages 99-116

Chapter 6 Optical Force Microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; INSTRUMENTATION; LASER; METHODOLOGY; MICROMANIPULATION; MICROSCOPY; OPTICS; REVIEW; THEORETICAL MODEL;

EID: 34547650140     PISSN: 0091679X     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S0091-679X(08)60404-5     Document Type: Article
Times cited : (8)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.