Application of a semiconductor tip to capacitance microscopy

Applied Physics Letters

Volumn 73, Issue 4, 1998, Pages 544-546

  Goto, Kazuya ^a   Hane, Kazuhiro ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001640150     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121927     Document Type: Article

References (16)

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