Simultaneous Measurement of Refractive Index and Thickness of Transparent Plates by Low Coherence Interferometry - Proposal and Demonstration

Optics InfoBase Conference Papers

Volumn , Issue , 1996, Pages 332-335

  Ohmi, M ^a   Shiraishi, T ^b   Tajiri, H ^b   Haruna, M ^a,b  

^a OSAKA UNIVERSITY MEDICAL SCHOOL   (Japan)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY;

CONDITION; FOCUSING LENS; INDEX N; LOW COHERENCE INTERFEROMETRY; MEASUREMENT ACCURACY; MEASUREMENT OF REFRACTIVE INDICES; MEASUREMENTS OF; OBJECT THICKNESS; SIMULTANEOUS MEASUREMENT; TRANSLATION STAGE;

REFRACTIVE INDEX;

EID: 4043076202     PISSN: None     EISSN: 21622701     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

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2. R. C. Youngquist, S. Carr and D. E. N. Davies, Opt. Lett. 12, p. 158 (1987).
3. C. K. Hitzenberger, Appl. Opt. 31, p. 6637 (1992).
4. J. A. Izatt, M. R. Hee, G. M. Owen, E. A. Swanson and J. G. Fujimoto, Opt. L&t. 19, p. 590 (1994).