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Volumn 59, Issue 7, 1999, Pages 4568-4571

Light-induced creation of metastable defects in hydrogenated amorphous silicon studied by computer simulations of constant photocurrent measurements

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[No Author keywords available]

Indexed keywords


EID: 0001628396     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.4568     Document Type: Article
Times cited : (12)

References (26)
  • 18
    • 85037881298 scopus 로고    scopus 로고
    • The defect structure according to the standard DOS model can be seen for instance in Fig. 4 of Ref
    • The defect structure according to the standard DOS model can be seen for instance in Fig. 4 of Ref. 3.
  • 23
    • 0006629649 scopus 로고
    • E. A. Schiff, M. J. Thompson, A. Madan, P. G. LeComber, Materials Research Society, Pittsburgh, and, in, edited by, and, MRS Symposia Proceedings 297 p
    • M. Brandt, A. Asano, and M. Stutzmann, in Amorphous Silicon Technology—1993, edited by E. A. Schiff, M. J. Thompson, A. Madan, and P. G. LeComber, MRS Symposia Proceedings No. 297 (Materials Research Society, Pittsburgh, 1993), p. 201.
    • (1993) Amorphous Silicon Technology—1993 , pp. 201
    • Brandt, M.1    Asano, A.2    Stutzmann, M.3
  • 26
    • 85037889302 scopus 로고    scopus 로고
    • M. Hack, E. A. Schiff, S. Wagner, A. Matsuda, R. Schropp, Materials Research Society, Pittsburgh, and, in, edited by, and, MRS Symposia Proceedings 420 p
    • H. Stiebig, F. Siebke, and R. Carius, in Amorphous Silicon Technology—1996, edited by M. Hack, E. A. Schiff, S. Wagner, A. Matsuda, and R. Schropp, MRS Symposia Proceedings No. 420 (Materials Research Society, Pittsburgh, 1996), p. 715.
    • (1996) Amorphous Silicon Technology—1996 , pp. 715
    • Stiebig, H.1    Siebke, F.2    Carius, R.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.