Measurement of the x-ray diffraction phase in a 2d crystal

Physical Review Letters

Volumn 79, Issue 7, 1997, Pages 1285-1288

  Baltes, H ^a   Yacoby, Y ^b   Pindak, R ^a   Clarke, R ^c   Pfeiffer, L ^a   Berman, L ^d  

^a LUCENT TECHNOLOGIES   (United States)

^b HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^c UNIVERSITY OF MICHIGAN   (United States)

^d BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001060996     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.79.1285     Document Type: Article

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