Detection of gate oxide charge trapping by second-harmonic generation

Applied Physics Letters

Volumn 75, Issue 22, 1999, Pages 3506-3508

  Fang, J ^a   Li, G P ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001608807     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125370     Document Type: Article

References (11)

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