A Combination Study of Conductivity and Contact Potential in Low-Field-Emission Carbon Films by Conductive Scanning Probe Microscopy

New Diamond and Frontier Carbon Technology

Volumn 9, Issue 1, 1999, Pages 53-61

  Zhang, Li ^a   Sakai, Tadashi ^a   Sakuma, Naoshi ^a   Ono, Tomio ^a   Nakayama, Kazuya ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

Carbon films; Conductive AFM KFM SPM; Conductivity; Contact potential difference; Electron field emission

Indexed keywords

EID: 0033261205     PISSN: 13449931     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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