Tolerance of optical interconnections to misalignment

Applied Optics

Volumn 38, Issue 11, 1999, Pages 2282-2290

  Neilson, David T ^a,b  

^a NEC LABORATORIES AMERICA   (United States)

^b NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001539025     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.002282     Document Type: Article

References (19)

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