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Volumn 41, Issue 1, 1997, Pages 42-52

Limit to the bit-rate capacity of electrical interconnects from the aspect ratio of the system architecture

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0002435274     PISSN: 07437315     EISSN: None     Source Type: Journal    
DOI: 10.1006/jpdc.1996.1285     Document Type: Article
Times cited : (243)

References (27)
  • 2
    • 0013293788 scopus 로고
    • The skin effect: II. The skin effect at high frequencies
    • Casimir, H. B. G., and Ubbink, J., The skin effect: II. The skin effect at high frequencies. Philips Tech. Rev. 28, 300-315 (1967).
    • (1967) Philips Tech. Rev. , vol.28 , pp. 300-315
    • Casimir, H.B.G.1    Ubbink, J.2
  • 3
    • 0039157191 scopus 로고
    • Reduction of skin effect losses by the use of laminated conductors
    • Clogston, A. M., Reduction of skin effect losses by the use of laminated conductors. Bell Syst. Tech. J. 30, 491-529 (1951).
    • (1951) Bell Syst. Tech. J. , vol.30 , pp. 491-529
    • Clogston, A.M.1
  • 4
    • 0027353426 scopus 로고
    • Recent research trends and issues in photonic switching technologies
    • Egawa, T., Yukimatsu, K., and Yamasaki, K., Recent research trends and issues in photonic switching technologies. NTT Rev. 5 (1), 30-37, (1993).
    • (1993) NTT Rev. , vol.5 , Issue.1 , pp. 30-37
    • Egawa, T.1    Yukimatsu, K.2    Yamasaki, K.3
  • 6
    • 0030113510 scopus 로고    scopus 로고
    • Extending the range of copper for fiber channel interconnects
    • Apr.
    • Foster, C., and Van Duesen, H., Extending the range of copper for fiber channel interconnects. Electronic Packaging and Production, 59-64 (Apr. 1996).
    • (1996) Electronic Packaging and Production , pp. 59-64
    • Foster, C.1    Van Duesen, H.2
  • 10
    • 85030052703 scopus 로고    scopus 로고
    • ITT Pomona Electronics
    • ITT Pomona Electronics.
  • 15
    • 0024664514 scopus 로고
    • Electrical resistance as a limiting factor for high-performance computer packaging
    • May
    • Masaki, A., Electrical resistance as a limiting factor for high-performance computer packaging. IEEE Circuits Devices Magazine 22-26 (May 1989).
    • (1989) IEEE Circuits Devices Magazine , pp. 22-26
    • Masaki, A.1
  • 17
    • 0005686558 scopus 로고    scopus 로고
    • Dense optical interconnects for silicon electronics
    • A. Consortini, (Ed.), Academic Press, San Diego
    • Miller, D. A. B., Dense optical interconnects for silicon electronics. In A. Consortini, (Ed.), Trends in Optics Research, Development and Applications. Academic Press, San Diego, 1996, pp. 207-222.
    • (1996) Trends in Optics Research, Development and Applications , pp. 207-222
    • Miller, D.A.B.1
  • 19
    • 84975575716 scopus 로고
    • Optics for low-energy communication inside digital processors: Quantum detectors, sources, and modulators as efficient impedance converters
    • Miller, D. A. B., Optics for low-energy communication inside digital processors: Quantum detectors, sources, and modulators as efficient impedance converters. Optics Lett. 14, 146-148 (1989).
    • (1989) Optics Lett. , vol.14 , pp. 146-148
    • Miller, D.A.B.1
  • 22
    • 0039157188 scopus 로고
    • The limitations of interconnections in providing communication between an array of points
    • S. K. Tewksbury (Ed.). Plenum Press, New York
    • Ozaktas, H. M., and Goodman, J. W., The limitations of interconnections in providing communication between an array of points. In S. K. Tewksbury (Ed.). Frontiers in Computing Systems Research, Vol. 2 Plenum Press, New York, 1991, pp. 61-130.
    • (1991) Frontiers in Computing Systems Research , vol.2 , pp. 61-130
    • Ozaktas, H.M.1    Goodman, J.W.2
  • 27
    • 84937740897 scopus 로고
    • Transient analysis of coaxial cables considering skin effect
    • Wigington, R. L., and Nahman, N. S., Transient analysis of coaxial cables considering skin effect. Proc. IRE 45, 166-174 (1957).
    • (1957) Proc. IRE , vol.45 , pp. 166-174
    • Wigington, R.L.1    Nahman, N.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.