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Volumn 82, Issue 6, 1997, Pages 2855-2861

Transient enhanced diffusion of boron in presence of end-of-range defects

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001495423     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366117     Document Type: Article
Times cited : (49)

References (41)
  • 11
    • 7044271743 scopus 로고    scopus 로고
    • Ph.D. thesis, Toulouse
    • C. Bonafos, Ph.D. thesis, Toulouse, 1996.
    • (1996)
    • Bonafos, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.