Template-Engaged Replacement Reaction: A One-Step Approach to the Large-Scale Synthesis of Metal Nanostructures with Hollow Interiors

Nano Letters

Volumn 2, Issue 5, 2002, Pages 481-485

  Sun, Yugang ^a   Mayers, Brian T ^a   Xia, Younan ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001489979     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl025531v     Document Type: Article

References (46)

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36. 2O (99.9%, Alfa Aesar) and platinum acetate (98%, City Chemical LLC) as precursors. The UV-vis absorption spectra were recorded on a Hewlett-Packard 8452A spectrometer (Palo Alto, CA). The transmission electron microscopy (TEM) samples were prepared by placing small drops of reaction solutions (diluted by ∼5 times with water) on copper grids, and allowing the solvent to slowly evaporate at room temperature in a fume hood. The TEM images and electron diffraction patterns were taken using a JEOL microscope (1200EX II) operated at 80 kV. The electron beam spot was ∼100 nm in diameter. The high-resolution TEM (HRTEM) images were captured using a TOPCON 002B microscope operated at 200 kV. The scanning electron microscopy (SEM) images were obtained using a JEOL field-emission microscope (6300F) operated at 15 kV.
37. 2O (99.9%, Alfa Aesar) and platinum acetate (98%, City Chemical LLC) as precursors. The UV-vis absorption spectra were recorded on a Hewlett-Packard 8452A spectrometer (Palo Alto, CA). The transmission electron microscopy (TEM) samples were prepared by placing small drops of reaction solutions (diluted by ∼5 times with water) on copper grids, and allowing the solvent to slowly evaporate at room temperature in a fume hood. The TEM images and electron diffraction patterns were taken using a JEOL microscope (1200EX II) operated at 80 kV. The electron beam spot was ∼100 nm in diameter. The high-resolution TEM (HRTEM) images were captured using a TOPCON 002B microscope operated at 200 kV. The scanning electron microscopy (SEM) images were obtained using a JEOL field-emission microscope (6300F) operated at 15 kV.
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