Measurements and predictions of light scattering by clear coatings

Applied Optics

Volumn 40, Issue 13, 2001, Pages 2159-2168

  McKnight, Mary E ^a   Vorburger, Theodore V ^a   Marx, Egon ^a   Nadal, Maria E ^a   Barnes, P Yvonne ^a   Galler, Michael A ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; COATING TECHNIQUES; DIELECTRIC MATERIALS; ELECTROMAGNETIC WAVE SCATTERING; INTERFEROMETRY; MICROSCOPES; NUMERICAL METHODS; REFLECTOMETERS;

SCATTERED LIGHT WAVES;

LIGHT SCATTERING;

EID: 0001421768     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.002159     Document Type: Article

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