Electromigration saturation in a simple interconnect tree

Journal of Applied Physics

Volumn 88, Issue 5, 2000, Pages 2382-2385

  Hau Riege, Stefan P ^a,b   Thompson, Carl V ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001398565     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1288019     Document Type: Article

References (14)

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12. A description and demonstration of MIT/EmSim (Electromigration Simulator) is accessible on the World Wide Web at http://nirvana.mit.edu/ emsim.
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