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Volumn 32, Issue 5 PART 2, 1996, Pages 4627-4629

HREM study of Co/Cu/Co/MnFe spin valves

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; INTERDIFFUSION (SOLIDS); INTERFACES (MATERIALS); MAGNETIC PROPERTIES; MAGNETIC THIN FILMS; MAGNETORESISTANCE; MULTILAYERS; NUMERICAL ANALYSIS; TITANIUM;

EID: 0030246224     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.539100     Document Type: Article
Times cited : (26)

References (6)
  • 2
    • 0026204646 scopus 로고
    • HREM of interfaces in FCC materials
    • K.L Merkle, "HREM of interfaces in FCC materials'' Ultramicroscopy Vol 37 (1991), pp 130-152.
    • (1991) Ultramicroscopy , vol.37 , pp. 130-152
    • Merkle, K.L.1
  • 4
    • 36449004598 scopus 로고
    • Orientational dependence of the exchange biasing in MBE-grown NiFe/FeMn bilayers
    • R. Jungblut, R Coehoorn, M.T Johnson, Jaan de Stegge, A. Reinders, "Orientational dependence of the exchange biasing in MBE-grown NiFe/FeMn bilayers," J. Appl. Phys. 75 (1994). pp 6659-6664.
    • (1994) J. Appl. Phys. , vol.75 , pp. 6659-6664
    • Jungblut, R.1    Coehoorn, R.2    Johnson, M.T.3    De Stegge, J.4    Reinders, A.5
  • 5
    • 0028257058 scopus 로고
    • Magnetoresistance and preferred orientation in FeMn/NiFe /Cu/NiFe sandwiches with various buffer layer,''
    • R. Nakatani, K. Hoshino, S. Nogughi, Y. Sugita, "Magnetoresistance and preferred orientation in FeMn/NiFe /Cu/NiFe sandwiches with various buffer layer,'' Jpn. J. Appl. Phys. Vol 33 (1994), pp 133-137
    • (1994) Jpn. J. Appl. Phys. , vol.33 , pp. 133-137
    • Nakatani, R.1    Hoshino, K.2    Nogughi, S.3    Sugita, Y.4
  • 6
    • 33748014632 scopus 로고
    • Characterisation of interfaces by HREM
    • J.L. Rouviere, "Characterisation of interfaces by HREM," Electron Microscopy ICEM13, Vol 2A (1994), pp 123-126.
    • (1994) Electron Microscopy ICEM13 , vol.2 A , pp. 123-126
    • Rouviere, J.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.