Electron microscopy and Rutherford backscattering study of nucleation and growth in nanosized W-Ti-O thin films

Journal of Applied Physics

Volumn 88, Issue 2, 2000, Pages 1097-1103

  Ferroni, M ^a   Guidi, V ^a,f   Martinelli, G ^a   Comini, E ^b   Sberveglieri, G ^b   Boscarino, D ^c,d   Della Mea, G ^e  

^a UNIVERSITY OF FERRARA   (Italy)

^b UNIVERSITY OF BRESCIA   (Italy)

^c LABORATORI NAZIONALI DI LEGNARO   (Italy)

^d UNIVERSITY OF PADOVA   (Italy)

^e UNIVERSITY OF TRENTO   (Italy)

^f INFN SEZIONE DI FERRARA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001209425     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373782     Document Type: Article

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