High resolution reflectivity diffractometer on Station 2.3 (Daresbury Laboratory)

Review of Scientific Instruments

Volumn 69, Issue 3, 1998, Pages 1224-1229

  Tang, C C ^a   Collins, S P ^a   Murphy, B M ^a   Telling, N D ^b   Wogelius, R A ^c   Teat, S J ^d  

^a DARESBURY LABORATORY   (United Kingdom)

^b LOUGHBOROUGH UNIVERSITY   (United Kingdom)

^c UNIVERSITY OF MANCHESTER   (United Kingdom)

^d NEWCASTLE UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001208706     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148754     Document Type: Article

References (28)

1. Physics, Fabrication and Applications of Multilayered Structures, edited by P. Dhez and C. Weisbuch (Plenum, New York, 1988).
2. The Materials Science of Thin Films, edited by M. Ohring (Academic, London, 1992).
3. E. E. Fullerton, J. Pearson, C. H. Sowers, S. D. Bader, X. Z. Wu, and S. K. Sinha, Phys. Rev. B 48, 17432 (1993).
4. For a review see, T. W. Barbee, Jr., Proc. SPIE 563, 2 (1985).
5. K. Kagawa, H. Kano, A. Okabe, A. Suzuki, and K. Hayashi, J. Appl. Phys. 75, 6540 (1994).
6. S. S. P. Parkin, R. Bhadra, and K. P. Roche, Phys. Rev. Lett. 66, 2152 (1991).
7. Y. Waseda, Novel Application of Anomalous (Resonance) X-ray Scattering for the Structural Characterisation of Disordered Materials (Springer, Berlin, 1984).
8. N. Nakayama, I. Moritani, T. Shinjo, Y. Fujii, and S. Sasaki, J. Phys. F 18, 429 (1988).
9. P. H. Fuoss, K. S. Liang, and P. Eisenberger, Synchrotron Radiation Research: Advances in Surface and Interface Science, edited by R. Z. Bachrach (Plenum, New York, 1992), Vol. 1, pp. 385-419.
10. F. Adibi, I. Petrov, J. E. Greene, U. Wahlström, and J.-E. Sundgren, J. Vac. Sci. Technol. A 11, 136 (1993).
11. S. P. Vernon, D. G. Sterns, and R. S. Rosen, Appl. Opt. 32, 6969 (1993).
12. N. D. Telling, M. Petty, and M. D. Crapper, J. Vac. Sci. Technol. A 16, 145 (1998).
13. R. J. Cernik, P. K. Murray, P. Pattison, and A. N. Fitch, J. Appl. Crystallogr. 23, 292 (1990).
14. S. P. Collins, R. J. Cernik, P. Pattison, A. M. T. Bell, and A. N. Fitch, Rev. Sci. Instrum. 63, 1013 (1992).
15. W. Parrish, M. Hart, C. G. Erickson, N. Masciocchi, and T. C. Huang, Adv. X-ray Anal. 29, 243 (1986).
16. S. Cockerton and B. K. Tanner, Adv. X-Ray Anal. 38, 371 (1995).
17. M. C. Miller, K. S. Ackroyd, and G. Oszlanyi, Daresbury Preprint DL/ CSE/P29E and presented at ESONE 8th International Coneference on Real Time Data (RT94), Dubna, Russia (1994).
18. C. C. Tang, M. C. Miller, S. M. Clark, M. A. Player, and G. R. G. Craib, J. Synchrotron Radiat. 3, 6 (1996).
19. S. K. Sinha, E. B. Sirota, S. Garoff, and H. B. Stanley, Phys. Rev. B 38, 2297 (1988).
20. S. K. Sinha, Physica B 173, 25 (1991).
21. D. E. Savage, J. Kleiner, N. Schimke, Y.-H. Phang, T. Jankowski, J. Jacobs, R. Kariotis, and M. G. Lagally, J. Appl. Phys. 69, 1411 (1991).
22. L. G. Parratt, Phys. Rev. 95, 359 (1954).
23. D. K. Bowen and M. Wormington, Adv. X-Ray Anal. 36, 171 (1993).
24. B. B. Mandelbrodt, The Fractal Geometry of Nature (Freeman, New York, 1982).
25. R. F. Voss, Fundamental Algorithms for Computer Graphics, edited by R. A. Earnshaw (Springer, Berlin, 1985).
26. I. Pape, T. P. A. Hase, B. K. Tanner, H. Laidler, C. Emmerson, T. Shen, and B. J. Hickey, J. Magn. Magn. Mater. 156, 373 (1996).
27. B. K. Tanner, D. E. Joyce, T. P. A. Hase, I. Pape, and P. J. Grundy, Adv. X-Ray Anal. 40, (1997).
28. N. D. Telling, M. D. Crapper, D. R. Loveti, S. Guilfoyle, C. C. Tang, and M. Petty, Thin Solid Films (to be published).