Giant magnetoresistance and interface structure of Cu/Co multilayers grown by MBE on Si (111) substrates with copper-silicide buffers

Journal of Magnetism and Magnetic Materials

Volumn 156, Issue 1-3, 1996, Pages 373-374

  Pape, I ^a   Hase, T P A ^a   Tanner, B K ^a   Laidler, H ^a   Emmerson, C ^a   Shen, T ^a   Hickey, B J ^a  

^a DURHAM UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON SCATTERING; INTERFACES (MATERIALS); MAGNETORESISTANCE; MOLECULAR BEAM EPITAXY; NIOBIUM; SAPPHIRE; SEMICONDUCTING SILICON; SURFACE ROUGHNESS;

COBALT COPPER MULTILAYERS; COPPER COBALT MULTILAYERS; COPPER SILICIDE BUFFER LAYER; DIFFUSE SYNCHROTRON X RAY SCATTERING; GIANT MAGNETORESISTANCE; GRAZING INCIDENCE SPECULAR; INTERFACE STRUCTURE;

MULTILAYERS;

EID: 0030121036     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-8853(95)00904-3     Document Type: Article

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