193-nm excimer-laser-induced densification of fused silica

Optics Letters

Volumn 21, Issue 24, 1996, Pages 1960-1962

  Allan, Douglas C ^a   Smith, Charlene ^a   Borrelli, N F ^a   Seward III, T P ^a  

^a Corning Incorporated ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001187910     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.21.001960     Document Type: Article

References (16)

1. W. Primak and R. Kampwirth, J. Appl. Phys. 39, 5651 (1968); W. Primak, J. Appl. Phys. 49, 2572 (1977).
2. W. Primak and R. Kampwirth, J. Appl. Phys. 39, 5651 (1968); W. Primak, J. Appl. Phys. 49, 2572 (1977).
3. C. B. Norris and E. P. EerNisse, J. Appl. Phys. 45, 3876 (1974).
4. T. A. Dellin, D. A. Tichenor, and E. H. Barsis, J. Appl. Phys. 48, 1131 (1977).
5. E. P. EerNisse, J. Appl. Phys. 45, 167 (1974).
6. J. A. Ruller and E. J. Friebele, J. Non-Cryst. Solids 136, 163 (1991).
7. C. Fiori and R. A. B. Devine, Phys. Rev. B 33, 2972 (1986).
8. M. Rothschild, D. J. Erlich, and D. C. Shaver, Appl. Phys. Lett. 55, 1276 (1989).
9. P. M. Schermerhorn, Proc. SPIE 1835, 70 (1992).
10. R. Schenker, P. Schermerhorn, and W. G. Oldham, J. Vac. Sci. 12, 3275 (1994).
11. R. Schenker, L. Eichner, H. Vaidya, S. Vaidya, P. Schermerhorn, D. Fladd, and W. G. Oldham, Proc. SPIE 2428, 458 (1995).
12. R. Schenker, L. Eichner, H. Vaidya, S. Vaidya, and W. G. Oldham, Proc. SPIE 2440, 118 (1995).
13. R. Schenker, F. Piao, and W. G. Oldham, Proc. SPIE 2726, 698 (1996).
14. N. F. Borrelli, C. Smith, D. C. Allan, and T. P. Seward III, "Densification of fused silica under 193 nm excitation," J. Opt. Soc. Am. B (to be published).
15. G. Williams, J. Non-Cryst. Solids 131-133, 1 (1991), and references therein.
16. A stretched exponential function, sometimes referred to Kohlrausch kinetics, has been used to predict a power law dependence for radiation-induced production of defects, observed as E′ centers, in silica. See V. A. Mashkov, W. R. Austin, L. Zhang, and R. G. Leisure, Phys. Rev. Lett. 76, 2926 (1996).