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Volumn 70, Issue 17, 1997, Pages 2288-2290
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In situ Si flux cleaning technique for producing atomically flat Si(100) surfaces at low temperature
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001162919
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.119083 Document Type: Article |
Times cited : (38)
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References (18)
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