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Volumn 70, Issue 5, 1997, Pages 619-621

Fabrication of 2-nm-wide silicon quantum wires through a combination of a partially-shifted resist pattern and orientation-dependent etching

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[No Author keywords available]

Indexed keywords


EID: 0001127448     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118331     Document Type: Article
Times cited : (52)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.