Interferometric characterization of subwavelength lamellar gratings

Applied Optics

Volumn 38, Issue 23, 1999, Pages 4980-4984

  Lalanne, Philippe ^a   Pichon, P ^a   Chavel, P ^a   Cambril, E ^a   Launois, H ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001120285     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.004980     Document Type: Article

References (17)

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