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Volumn 35, Issue 13, 1996, Pages 2235-2238

Applications of the normal-incidence rotating-sample ellipsometer to high- and low-spatial-frequency gratings

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EID: 0042952520     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.002235     Document Type: Article
Times cited : (8)

References (17)
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    • (formerly Milton Roy Co.), Rochester, N.Y
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  • 16
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    • It is possible to obtain independent information about the surface profile using techniques such as atomic-force microscopy and to measure the optical constants of the deposited gold film on an optical flat during the same coating cycle used to prepare the grating
    • It is possible to obtain independent information about the surface profile using techniques such as atomic-force microscopy and to measure the optical constants of the deposited gold film on an optical flat during the same coating cycle used to prepare the grating.
  • 17
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    • American Holographic, Inc., Littleton, Mass
    • American Holographic, Inc., Littleton, Mass.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.