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Volumn 21, Issue 20, 1996, Pages 1619-1621
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Angle-resolved polarimetric phase measurement for the characterization of gratings
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0037900582
PISSN: 01469592
EISSN: None
Source Type: Journal
DOI: 10.1364/OL.21.001619 Document Type: Article |
Times cited : (5)
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References (13)
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