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Volumn 73, Issue 22, 1998, Pages 3273-3275

Energy-dispersive x-ray imaging of an InGaN/GaN bilayer on sapphire

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001081537     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122742     Document Type: Article
Times cited : (8)

References (16)
  • 8
    • 22244461295 scopus 로고    scopus 로고
    • Samples provided by M. V. Yakushev, Department of Physics, University of Salford, UK
    • Samples provided by M. V. Yakushev, Department of Physics, University of Salford, UK.
  • 11
    • 0004129962 scopus 로고
    • edited by Oxford University Press, London Monte Carlo simulation programs written by Joy can be downloaded from
    • Monte Carlo Modeling for Electron Microscopy and Microanalysis, edited by D. C. Joy (Oxford University Press, London, 1995). Monte Carlo simulation programs written by Joy can be downloaded from: http://www2.arnes.si/sgszmera1/monte.html
    • (1995) Monte Carlo Modeling for Electron Microscopy and Microanalysis
    • Joy, D.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.