Hexagonal growth hillocks in GaN epilayers

Materials Research Society Symposium - Proceedings

Volumn 449, Issue , 1997, Pages 471-476

  Middleton, P O ^a   Trager Cowan, C ^a   Mohammed, A ^a   O'Donnell, K P ^a   Van Der Stricht, W ^a   Moerman, I ^a   Demeester, P ^a  

^a UNIVERSITY OF STRATHCLYDE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CATHODOLUMINESCENCE; EPITAXIAL GROWTH; METALLORGANIC VAPOR PHASE EPITAXY; MICROSCOPIC EXAMINATION; MORPHOLOGY; NITRIDES; SEMICONDUCTING GALLIUM COMPOUNDS; SURFACE STRUCTURE;

GALLIUM NITRIDE; SURFACE MORPHOLOGY;

SEMICONDUCTING FILMS;

EID: 0030679047     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)