Investigation of Bragg surface diffraction in semiconductors and epitaxic structures by reciprocal-space analysis

Journal of Applied Crystallography

Volumn 32, Issue 5, 1999, Pages 871-877

  Morelhao S L ^a   Abramof, E ^b  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

^b INSTITUTO NACIONAL DE PESQUISAS ESPACIAIS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001026945     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889899007013     Document Type: Article

References (7)

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3. Chang, S. L. (1984). Multiple Diffraction of X-rays in Crystals, in Springer Ser. Solid-State Sci., Vol. 50. Berlin: Springer.
4. Fewster, P. (1991). J. Appl. Cryst. 24, 178-193.
5. Hayashi, M. A., Morelhão, S. L., Avanci, L. H., Cardoso, L. P., Sasaki, J. M., Kretly, L. C. & Chang, S. L. (1997). Appl. Phys. Lett. 71, 2614-2616.
6. Morelhão, S. L. & Cardoso, L. P. (1996). J. Appl. Cryst. 29, 446-456.
7. Weckert, E. & Hümmer, K. (1997). Acta Cryst. A53, 108-153.