Tapping mode atomic force microscopy studies of the photoreduction of Ag+ on individual submicrometer TiO2 particles

Langmuir

Volumn 15, Issue 25, 1999, Pages 8569-8573

  Farneth, William E ^a   Scott McLean, R ^a   Bolt, John D ^a   Dokou, Eleni ^b   Barteau, Mark A ^b  

^a DUPONT COMPANY   (United States)

^b University of Delaware   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001025551     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9908844     Document Type: Article

References (19)

1. Mao, G.; Lobo, L.; Scaringe, R.; Ward, M. D. Chem. Mater. 1997, 9, 773.
2. Britt, D. W.; Hlady, V. Langmuir 1997, 13, 1873.
3. Smith, R. L.; Rohrer, G. S. J. Catal. 1998, 180, 270.
4. Morris-Hotsenpiller, P. A.; Bolt, J. D.; Farneth, W. E.; Lowekamp, J. B.; Rohrer, G. S. J. Phys. Chem. B 1998, 102, 3216.
5. Gaigneaux, E. M.; Ruiz, P.; Wolf, E. E.; Delmon B. J. Catal. 1997, 172, 247.
6. Bickmore, B. R.; Hochella, M. F.; Bosbach, D.; Charlet, L. Clays Clay Miner., in press.
7. Matsushita, S. I.; Miwa, T.; Tryk, D. A.; Fujishima, A. Langmuir 1998, 14, 6441.
8. Maganov, S. N.; Elings, V.; Whangbo, M.-H. Surf. Sci. Lett. 1997, 375, L385.
9. 2). The rutile sample has been described in more detail previously. Lusvardi, V. S.; Barteau, M. A.; Farneth, W. E. J. Catal. 1995, 153, 41.
10. Eagles, D. M. Phys. Chem. Solids 1965, 25, 1243.
11. Lowekamp, J. B.; Rohrer, G. S.; Morris-Hotsenpiller, P. A.; Bolt, J. D.; Farneth, W. E. J. Phys. Chem. B 1998, 102, 7323.
12. 2 at room temperature for several minutes.
13. Hoffman, M. R.; Martin, S. T.; Choi, W. Y.; Bahnemann, D. W. Chem. Rev. 1995, 95, 69.
14. Sahyun, M. R. V.; Serpone, N. Langmuir 1997, 132, 5082.
15. Bearing Analysis and Section Analysis software supplied by Digital Instruments was applied to selected areas on before and after images. The average vertical dimensions of the Ag particles are estimated from cross sections. Lateral dimensions are less reliable indicators of particle size in this size range, without corrections for finite tip radius effects.
16. Goodenough, J. B.; Hammett, A.; Huber, G.; Hulliger, F.; Leib, M.; Ramasesha, S. K.; Werheit, H. In Landolt-Bornstein, Numerical Data and Functional Relationships in Science and Technology; Hellwige, K.-H., Madelung, O., Eds.; Springer-Verlag: New York, 1984; Vol. 17, subvol. G Chapter 9.15.2.1.
17. Tang, H.; Berger, H.; Schmid, P. E.; Levy, F. Solid State Commun. 1994, 92 (3), 267.
18. Brandisch, R.; Bar, G.; Whangbo, M.-H. Langmuir 1997, 13, 6349.
19. Wang, R.; Hashimoto, K.; Fujishima, A.; Chikuni, M.; Kojima, E.; Kitamura, A.; Shimohigoshi, M.; Watanabe, T. Adv. Mater. 1998, 10, 136.