Recent insights into the physical modeling of the spreading resistance point contact

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 1, 1996, Pages 358-368

  Clarysse, T ^a   De Wolf, P ^a   Bender, H ^a   Vandervorst, W ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001012480     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588475     Document Type: Article

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