Connecting disorder and magnetic properties in CoFe thin films

Applied Physics Letters

Volumn 76, Issue 18, 2000, Pages 2603-2605

  Freeland, J W ^a   Bussmann, K ^b   Idzerda, Y U ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000937445     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126422     Document Type: Article

References (24)

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