Effect of microstructure on the magnetoresistive properties of NiFe/Co(CoFe)/Al(Ta)-oxide/Co(CoFe) tunnel junctions

Journal of Applied Physics

Volumn 89, Issue 5, 2001, Pages 2752-2755

  Kyung, H ^a   Ahn, H S ^a   Yoon, C S ^a   Kim, C K ^a   Song, Ohsung ^b   Miyazaki, T ^b   Ando, Y ^b   Kubota, H ^b  

^a Hanyang University   (South Korea)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000926241     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1343519     Document Type: Article

References (9)

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