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Volumn 76, Issue 5, 2000, Pages 583-585

A full-band Monte Carlo model for the temperature dependence of electron and hole transport in silicon

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[No Author keywords available]

Indexed keywords


EID: 0000923887     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125824     Document Type: Article
Times cited : (38)

References (22)
  • 15
    • 0032607404 scopus 로고    scopus 로고
    • We have previously applied this model to the special case of strained silicon, where it successfully removes the parameter ambiguity of existing valley models. B. Fischer and K. R. Hofmann, Appl. Phys. Lett. 74, 2185 (1999).
    • (1999) Appl. Phys. Lett. , vol.74 , pp. 2185
    • Fischer, B.1    Hofmann, K.R.2
  • 19


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.