Precision measurement of wavelengths emitted by a molecular fluorine laser at 157 nm

Applied Optics

Volumn 40, Issue 12, 2001, Pages 1974-1978

  Sansonetti, Craig J ^a   Reader, Joseph ^a   Vogler, Klaus ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b Lambda Physik GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; ELECTRIC POTENTIAL; FLUORINE; OPTICAL BEAM SPLITTERS; REFRACTIVE INDEX; SPECTROGRAPHS; STANDARDS;

OPTICAL PATHS;

LASER OPTICS;

EID: 0000922875     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.001974     Document Type: Article

References (15)

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7. Commercial products are identified in this paper for adequate specification of the experimental procedure. This identification does not imply recommendation or endorsement by NIST.
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