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Volumn 3244, Issue , 1997, Pages 331-340
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A study of the effects of polishing, etching, cleaving, and water leaching on the UV laser damage of fused silica
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Author keywords
355 nm; Damage morphology; Environmental effects.; Etching; Fused silica; Laser induced damage threshold; Microcracks; Sub surface damage; Surface contamination
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Indexed keywords
ETCHING;
HYDROLYSIS;
LASER DAMAGE;
LEACHING;
MICROCRACKS;
OPTICAL MICROSCOPY;
POLISHING;
SCANNING ELECTRON MICROSCOPY;
ULTRAVIOLET RADIATION;
CLEAVING;
DISTILLED WATER;
FUSED SILICA;
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EID: 0031289906
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.307041 Document Type: Conference Paper |
Times cited : (45)
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References (24)
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