Aging time dependence of catastrophic optical damage (COD) failure of a 0.98-μm GaInAs-GaInP strained quantum-well laser

IEEE Journal of Quantum Electronics

Volumn 33, Issue 1, 1997, Pages 66-70

  Hashimoto, Jun Ichi ^b,c   Yoshida, Ichiro ^b,c,d   Murata, Michio ^a,b,e   Katsuyama, Tsukuru ^b,d,f,g  

^a IEEE

^b SUMITOMO ELECTRIC INDUSTRIES LTD   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

^d NORTH CAROLINA STATE UNIVERSITY   (United States)

^e OSAKA UNIVERSITY   (Japan)

^f NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

^g Optoelectronics R and D Laboratories   (Japan)

Author keywords

Failure analysis; Gallium materials devices; Optical communication equipment; Reliability estimation; Reliability modeling; Reliability testing; Reliability theory; Semiconductor lasers

Indexed keywords

ELECTROLUMINESCENCE; FAILURE ANALYSIS; MATHEMATICAL MODELS; OPTICAL COMMUNICATION EQUIPMENT; RELIABILITY; RELIABILITY THEORY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR LASERS; STATISTICS;

CATASTROPHIC OPTICAL DAMAGE FAILURE; RELIABILITY ESTIMATION; RELIABILITY MODELLING; RELIABILITY TESTING; WEIBULL STATISTICS;

QUANTUM WELL LASERS;

EID: 0030736892     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/3.554891     Document Type: Article

References (11)

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