X-ray photoelectron spectroscopic evaluation of valence band offsets for strained Si1-xGex, Si1-yCy, and Si1-x-yGexCy on Si(001)

Applied Physics Letters

Volumn 70, Issue 20, 1997, Pages 2702-2704

  Kim, Myeongcheol ^a   Osten, H J ^a  

^a IHP   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000850561     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118998     Document Type: Article

References (13)

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