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Volumn 35, Issue 34, 1996, Pages 6740-6743

Deducing structural variations of the apex of probes used in near-field optical microscopy through simultaneous measurement of shear force and evanescent intensity

Author keywords

Evanescent intensity; Near field optical microscopy; Near field optical morphology of probe; Shear force; Simultaneous detection

Indexed keywords

COATING TECHNIQUES; ETCHING; FABRICATION; FORCE MEASUREMENT; IMAGING TECHNIQUES; LIGHT SCATTERING; LIGHTING; MICROSCOPES; OPTICAL VARIABLES MEASUREMENT; PROBES; SCANNING;

EID: 6144220063     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.006740     Document Type: Article
Times cited : (4)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.